Tencor P-1 Long Scan Profiler
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The Tencor P-1 Long Scan Profiler is a
computerized, high-sensitivity surface profiler that
measures roughness, waviness, and step height in
a variety of applications.  It features the ability to
measure micro-roughness with 1 Å resolution over
short distances as well as waviness over a full,
210-mm (8.2-in) scan.  The built-in PC/AT computing
power offers precise, automatic measurement
capability, data storage, and data analysis.  The
Tencor P-1 can profile a variety of materials,
including magnetic disks, semiconductor wafers,
precision-machined and polished surfaces,
ceramics for micro-electronics, glass for flat panel
displays and optical surfaces.